Silicon Wafer Flatness Measurement – Criterion
Silicon wafer flatness can be tested by capacitive displacement sensor ideal for measuring polished silicon wafer of resistivity ≤200Ω•cm, thickness ≤1000um ... Defects Gallium arsenide GaN substrate semiconductor wafer manufacturers Ge Single Crystals and Wafers InGaN Diffusion Ge solar cells gaas wafer μ-PCD InGaAs …